The AT4080 is part of Multilane’s high-speed instrumentation family for high volume production wafer and packaged silicon test. The AT4080 is a fully integrated extension of the V93000 tester experience, taking full advantage of the V93000 Smartest software tools and docking mechanics.

The AT4080 consists of 4 differential transmit channels that can be synchronized to other AT instruments in the V93000.

The Multilane instruments reside directly under the loadboard, allowing minimum coax cable length from the instruments to the device under test (DUT). SMPM Blindmate coax connections between the instruments and the loadboard allow quick DUT loadboard changeover during production testing.