Join us on Thursday January 21st to learn how MultiLane’s test solutions enable the adoption of 200G/400G optical and electrical interconnects.
Our Chinese representative, Terry Luo will overview a few topics including: TDECQ and Open Eye characterization of optical transceivers, thermal loopbacks for system testing, hardware FEC bit-error-rate analysis, s-parameter measurements of passive DACs.
In case you missed it or want to learn more about how MultiLane’s test solutions enable the adoption of 200G/400G optical and electrical interconnects, be sure to watch the recording here.
